✦ LIBER ✦
A unified negative-binomial distribution for yield analysis of defect-tolerant circuits
✍ Scribed by Koren, I.; Koren, Z.; Stepper, C.H.
- Book ID
- 119772175
- Publisher
- IEEE
- Year
- 1993
- Tongue
- English
- Weight
- 1003 KB
- Volume
- 42
- Category
- Article
- ISSN
- 0018-9340
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