✦ LIBER ✦
A unified approach to profiling the lateral distributions of both oxide charge and interface states in n-MOSFET's under various bias stress conditions
✍ Scribed by Shui-Ming Cheng; Cherng-Ming Yih; Jun-Chyi Yeh; Song-Nian Kuo; Chung, S.S.
- Book ID
- 114537033
- Publisher
- IEEE
- Year
- 1997
- Tongue
- English
- Weight
- 238 KB
- Volume
- 44
- Category
- Article
- ISSN
- 0018-9383
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