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A UHV contactless capacitance–voltage characterization method applicable to semiconductor layers grown on insulating substrates

✍ Scribed by Akazawa, Masamichi ;Hasegawa, Hideki


Book ID
105362168
Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
220 KB
Volume
195
Category
Article
ISSN
0031-8965

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