A two-dimensional probability model for
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Zhimin He; Han Tong Loh; Min Xie
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Article
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2007
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Elsevier Science
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English
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In this paper, a probabilistic approach is presented for the evaluation of the reliability of piezoelectric micro-actuators that takes into account the effects of both driving voltage and temperature. Based on the relationships between the lifetime and degradation mechanism of piezoelectric actuator