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A transmission electron microscopy study of the crystallization of ion-beam-mixed Pd80Si20 amorphous thin films

✍ Scribed by A.J. Janicki; B.C. Giessen; P.J. Grundy


Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
668 KB
Volume
167
Category
Article
ISSN
0040-6090

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