✦ LIBER ✦
A transmission electron microscopy study of microstructure evolution with increasing anneal temperature in Ti/Al ohmic contacts to n-GaN
✍ Scribed by A. N. Bright; D. M. Tricker; C. J. Humphreys; R. Davies
- Book ID
- 107452606
- Publisher
- Springer US
- Year
- 2001
- Tongue
- English
- Weight
- 547 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0361-5235
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