A transistor fault model for nMOS combinational circuits: Asad A. Ismaeel. Microelectron. J. 22(4), 15 (1991)

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 116 KB
• Volume: 32
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(92)90687-g