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A time-of-flight spectrometer for angle-resolved detection of low energy electrons in two dimensions

✍ Scribed by P.S. Kirchmann; L. Rettig; D. Nandi; U. Lipowski; M. Wolf; U. Bovensiepen


Book ID
106020960
Publisher
Springer
Year
2008
Tongue
English
Weight
602 KB
Volume
91
Category
Article
ISSN
1432-0630

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An electrostatic deflector has been designed and constructed that can be used in a reflecting time-of-flight mass spectrometer for either single-deflector or dual-deflector velocity selection in post-source decay measurements. The deflector consists of an interleaved set of parallel deflection elect