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A Time-Aware Fault Tolerance Scheme to Improve Reliability of Multilevel Phase-Change Memory in the Presence of Significant Resistance Drift

✍ Scribed by Xu, Wei; Zhang, Tong


Book ID
120520778
Publisher
IEEE
Year
2011
Tongue
English
Weight
896 KB
Volume
19
Category
Article
ISSN
1063-8210

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