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A Three-Dimensional Topography Measurement for Micro-nano Film Buckling Based on the Focusing Evaluation Function

✍ Scribed by H.K. Jia; S.B. Wang; L.A. Li; X.L. Xue; Z.M. Guo


Book ID
113846597
Publisher
Elsevier
Year
2011
Tongue
English
Weight
713 KB
Volume
19
Category
Article
ISSN
1875-3892

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