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A three-dimensional study of dislocation lines in an in-doped GaAs crystal by layer-by-layer tomography

✍ Scribed by Syuji Todoroki; Kazufumi Sakai; Tomoya Ogawa


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
287 KB
Volume
103
Category
Article
ISSN
0022-0248

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