A thomas-fermi description of the screening around the vacancy in silicon: charge state dependence: M. Lannoo and G. Allan. Solid-St. Comms., 33, 293 (1980)

• Publisher: Elsevier Science
• Year: 1980
• Tongue: English
• Weight: 116 KB
• Volume: 20
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(80)90727-1