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A thickness measurement technique based on low-coherence interferometry applied to a liquid film with thermal gradient

✍ Scribed by Nicolas Borgetto; Cédric Galizzi; Frédéric André; Dany Escudié


Book ID
108130909
Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
405 KB
Volume
34
Category
Article
ISSN
0894-1777

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