Effects of strain and strain rate on ele
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H.Q. Han; C.B. Shi; W.M. Xu; C.M. Carl
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Article
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2010
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Elsevier Science
β 267 KB
Surface electronic behavior of MEMS and NEMS can be characterized using the Kelvin probe technique by measurements of work function (WF). However, the physical mechanism responsible for such electronic behavior of a surface subjected to mechanical loading has not been completely understood. In this