Test-Retest Reliability of the GO-QOL: A
โ
C.B. Terwee; M.N. Gerding; F.W. Dekker; M.F. Prummel; J.P. van der Pol; W.M. Wie
๐
Article
๐
1999
๐
Elsevier Science
๐
English
โ 209 KB