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A test pattern selection method for a joint bounded-distance and encoding-based decoding algorithm of binary codes [Transactions Letters]

✍ Scribed by Tokushige, H.; Fossorier, M.P.C.; Kasami, T.


Book ID
114611618
Publisher
IEEE
Year
2010
Tongue
English
Weight
171 KB
Volume
58
Category
Article
ISSN
0090-6778

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