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A test of enhancing model accuracy in high-throughput crystallography

✍ Scribed by W. Bryan Arendall; Wolfram Tempel; Jane S. Richardson; Weihong Zhou; Shuren Wang; Ian W. Davis; Zhi-Jie Liu; John P. Rose; W. Michael Carson; Ming Luo; David C. Richardson; Bi-Cheng Wang


Book ID
106442367
Publisher
Springer Netherlands
Year
2005
Tongue
English
Weight
364 KB
Volume
6
Category
Article
ISSN
1345-711X

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