A test for lateral nonuniformities in MOS devices using only capacitance curves

✍ Scribed by J.R. Brews; A.D. Lopez

• Book ID: 107856042
• Publisher: Elsevier Science
• Year: 1973
• Tongue: English
• Weight: 999 KB
• Volume: 16
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(73)90082-8