The variable-range hopping expression R(T)= Ro e(Tยฐ/rl~ used to describe data for carbon and thick film chip resistors is discussed. For both kinds of resistors it was found that 1/4 \_\_\_(~ \_\_\_ 1/2, although for the thick film resistors the applicability of models originally used in doped semic
A technique for calibrating carbon resistor thermometers below 2 K
โ Scribed by D.A. Goer; E.F. Starr; G.R. Little; R.A. Erickson
- Publisher
- Elsevier Science
- Year
- 1974
- Tongue
- English
- Weight
- 516 KB
- Volume
- 14
- Category
- Article
- ISSN
- 0011-2275
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โฆ Synopsis
The usual method of calibrating carbon resistor thermometers against the vapour pressure of He 3 and He 4 is often inconvenient due to the nature of the experimental apparatus.
Culbert and Sungaila have proposed a heat capacity technique in which the resistancetemperature relation is deduced by comparing the calculated internal energy-temperature function of a known sample to the measured internal-resistance function for the same
sample. An improvement on their method utilizing holmium metal as a thermometric device is presented. The advantages, disadvantages, and reliability of this technique are discussed and a new carbon resistor thermometry equation of the form R = A + B/7" + C/T 2 is proposed.
๐ SIMILAR VOLUMES
We describe how a simple two-point calibration of a platinum resistance thermometer can be used to deduce the resistance-temperature relationship in the range 4.2 K ~ T <~ 273 K. This relationship is established by comparing the unknown thermometer to two carefully calibrated platinum resistance the