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A synchronous microsystem process using a dual-cylinder tool for the surface microstructures from solar cell silicon wafers

โœ Scribed by P. S. Pa


Book ID
106186151
Publisher
Springer-Verlag
Year
2011
Tongue
English
Weight
434 KB
Volume
17
Category
Article
ISSN
0946-7076

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The applicability of surface photovoltage (SPV) measurements for the detection of charge carrier injection processes at extremely thin absorber (ETA) interfaces was investigated. Interfaces of the ETA absorber PbS on nanocrystalline (nc-) TiO2 and ZrO2 were studied in comparison with dye-sensitized