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A Switch from High-Fidelity to Error-Prone DNA Double-Strand Break Repair Underlies Stress-Induced Mutation

✍ Scribed by Rebecca G. Ponder; Natalie C. Fonville; Susan M. Rosenberg


Book ID
116753959
Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
332 KB
Volume
19
Category
Article
ISSN
1097-2765

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