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A survival analysis of patent examination requests by Japanese electrical and electronic manufacturers

✍ Scribed by Nakata, Yoshifumi; Zhang, Xingyuan

Book ID: 115506340
Publisher: Taylor and Francis Group
Year: 2012
Tongue: English
Weight: 362 KB
Volume: 21
Category: Article
ISSN: 1043-8599
DOI: 10.1080/10438599.2010.537897

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