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A sub-0.5 μm bilevel lithographic process using the deep-UV electron-beam resist p(si-cms)

✍ Scribed by A. E. Novembre; M. J. Jurek; A. Kornblit; E. Reichmanis


Publisher
Society for Plastic Engineers
Year
1989
Tongue
English
Weight
812 KB
Volume
29
Category
Article
ISSN
0032-3888

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