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A study on thermal emission of charges at Si3N4—GaAs interfaces after annealing in N2 and N2 + H2 mixtures

✍ Scribed by J. Ivančo; I. Thurzo; L. Hulényi

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 413 KB
Volume: 40
Category: Article
ISSN: 0921-5107
DOI: 10.1016/0921-5107(96)01596-6

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