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A Study on the Failure Mechanism of a Phase-Change Memory in Write/Erase Cycling

✍ Scribed by Suyoun Lee; Jeung-hyun Jeong; Taek Sung Lee; Won Mok Kim; Byung-ki Cheong


Book ID
115537994
Publisher
IEEE
Year
2009
Tongue
English
Weight
428 KB
Volume
30
Category
Article
ISSN
0741-3106

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