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A Study on the Breakdown Mechanism of an Electroless-Plated Ni(P) Diffusion Barrier for Cu/Sn/Cu 3D Interconnect Bonding Structures

✍ Scribed by Byunghoon Lee; Haseok Jeon; Seong-Jae Jeon; Kee-Won Kwon; Hoo-Jeong Lee


Book ID
107457375
Publisher
Springer US
Year
2011
Tongue
English
Weight
535 KB
Volume
41
Category
Article
ISSN
0361-5235

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