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A study of using femtosecond LIBS in analyzing metallic thin film–semiconductor interface

✍ Scribed by A. H. Galmed; A. K. Kassem; H. Von Bergmann; M. A. Harith


Book ID
106029859
Publisher
Springer
Year
2010
Tongue
English
Weight
686 KB
Volume
102
Category
Article
ISSN
0721-7269

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