A study of ultra-thin film ion beam deposited (IBD) hydrogenated amorphous carbon (a-C:H) using atomic force microscopy (AFM) and transmission electron microscopy (TEM)

✍ Scribed by Lamberton, R.W.; Zhao, J.F.; Magill, D.; McLaughlin, J.A.; Maguire, P.D.

• Book ID: 122977016
• Publisher: Elsevier Science
• Year: 1998
• Tongue: English
• Weight: 544 KB
• Volume: 7
• Category: Article
• ISSN: 0925-9635
• DOI: 10.1016/S0925-9635(98)00153-8