A study of transistor reliability by physical analysis : J. Belmas, L'Onde Electrique, September (1963), pp. 927–933

• Book ID: 113189795
• Publisher: Elsevier Science
• Year: 1964
• Tongue: English
• Weight: 91 KB
• Volume: 3
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(64)90102-7