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A Study of Total Dose Mitigation Approaches for Charge Pumps in Phase-Locked Loop Applications

✍ Scribed by Horst, Stephen J.; Phillips, Stanley D.; Cressler, John D.; Kruckmeyer, Kirby; Eddy, Robert; Aude, Arlo; O'Farrell, Patrick; Zhang, Benyong; Wilcox, Edward; LaBel, Ken


Book ID
118254041
Publisher
IEEE
Year
2011
Tongue
English
Weight
667 KB
Volume
58
Category
Article
ISSN
0018-9499

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