✦ LIBER ✦

A study of thin film interconnects between dissimilar materials

✍ Scribed by M Lauriente; R Geisler; S Bassler; JM Winter

Publisher: Elsevier Science
Year: 1967
Tongue: English
Weight: 178 KB
Volume: 17
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(67)93185-5

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A study of stable thin film pressure and

A study of stable thin film pressure and strain transducer materials

✍ Z.H. Meiksin; E.J. Stolinski; H.B. Kuo; R.A. Mirchandani; K.J. Shah 📂 Article 📅 1972 🏛 Elsevier Science 🌐 English ⚖ 239 KB

A mathematical approach of the interface

A mathematical approach of the interface crack between dissimilar anisotropic composite materials

✍ K. Nakagawa; T. Anma; Shu-Jin Duan 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 609 KB

Introduction of stress functions around

Introduction of stress functions around a circular interface crack between dissimilar materials

✍ Y. Murase; K. Nakagawa; T. Hachiya; S.J. Duan 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 606 KB

The stress concentration around a circular interface crack between two dissimilar elastic planes is analysed in this paper. The constructive algorithm of the group of general stress functions which satisfy the crack boundary conditions is introduced. From that, six analytic solutions are selected to

A study of CdS thin film deposition

✍ M. Łepek; B. Dogil; R. Ciecholewski 📂 Article 📅 1983 🏛 Elsevier Science 🌐 English ⚖ 243 KB

Determining electromigration kinetics of

Determining electromigration kinetics of thin film interconnects : J. A. Schwarz. Semiconductor Int. 96 (March 1985)

📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 123 KB

Development of a thin film solar cell in

Development of a thin film solar cell interconnect for the PowerSphere concept

✍ Edward J. Simburger; James H. Matsumoto; Thomas W. Giants; Alexander Garcia III; 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 218 KB