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A study of the validity of capacitance-based method for extracting the effective channel length of MOSFET's

✍ Scribed by Latif, Z.; Ortiz-Conde, A.; Liou, J.J.; Sanchez, F.J.G.


Book ID
114536744
Publisher
IEEE
Year
1997
Tongue
English
Weight
128 KB
Volume
44
Category
Article
ISSN
0018-9383

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