𝔖 Bobbio Scriptorium
✦   LIBER   ✦

A study of the structure of a passive film using angle-resolved X-ray photo-electron spectroscopy

✍ Scribed by E. Akiyama; A. Kawashima; K. Asami; K. Hashimoto

Book ID
115848093
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
966 KB
Volume
38
Category
Article
ISSN
0010-938X

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Studies of the UV/Ozone oxidation of GaA
Studies of the UV/Ozone oxidation of GaAs using angle-resolved x-ray photoelectron spectroscopy
✍ B. J. Flinn; N. S. McIntyre πŸ“‚ Article πŸ“… 1990 πŸ› John Wiley and Sons 🌐 English βš– 938 KB

## Abstract Angle‐resolved x‐ray photoelectron spectroscopy (ARXPS) has been used to study the composition of oxides grown on γ€ˆ110〉 and γ€ˆ100〉 GaAs during exposure to UV/ozone. The effects of substrate treatments on oxide growth were compared on γ€ˆ100〉 surfaces exposed to an HF treatment and thermal

X-ray photo-electron spectroscopy as a m
X-ray photo-electron spectroscopy as a means of determining the band structure of carbons
✍ M Barber; P Swift; E.L Evans; J.M Thomas πŸ“‚ Article πŸ“… 1972 πŸ› Elsevier Science 🌐 English βš– 141 KB

ABSTRACTS ## 191. Deposition of carbon films with diamond properties S. Aisenberg and R. Chabot (Space Sciences Division, Whittaker Corporation, Waltham, Massachusetts). An ion beam deposition technique has been developed and used to deposit thin films of diamond-like carbon on room temperature su