A study of the relationship between junction depth and GaAs solar cell performance under a 1 MeV electron fluence

✍ Scribed by Peter Hacke; Masato Uesugi; Sumio Matsuda

• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 318 KB
• Volume: 35
• Category: Article
• ISSN: 0927-0248
• DOI: 10.1016/0927-0248(94)90130-9