A study of the degradation of poly(3-octylthiophene)-based light emitting diodes by Surface Enhanced Raman Scattering

✍ Scribed by E. Giorgetti; G. Margheri; T. Delrosso; S. Sottini; M. Muniz-Miranda; M. Innocenti

• Publisher: Springer
• Year: 2004
• Tongue: English
• Weight: 520 KB
• Volume: 79
• Category: Article
• ISSN: 0721-7269
• DOI: 10.1007/s00340-004-1592-5