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A Study of the Compositional Structure and Electrical Behaviour of Thin Silicon Oxynitride Layers Prepared by Rapid Thermal Processing

✍ Scribed by Beyer, R. ;Burghardt, H. ;Prösch, G. ;Thomas, E. ;Reich, R. ;Grambole, D. ;Herrmann, F. ;Weidner, G. ;Syhre, H. ;Dittmar, K.


Publisher
John Wiley and Sons
Year
1994
Tongue
English
Weight
381 KB
Volume
145
Category
Article
ISSN
0031-8965

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