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A study of sputter-induced defects in magnetron-sputtered CoSi2and TiSi2Schottky barriers onn- andp-type GaP

✍ Scribed by E. Kabushemeye; R. L. Meirhaeghe; W. H. Laflère; F. Cardon


Publisher
Springer
Year
1991
Tongue
English
Weight
563 KB
Volume
52
Category
Article
ISSN
1432-0630

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