✦ LIBER ✦
A study of interface trap generation by Fowler-Nordheim and substrate-hot-carrier stresses for 4-nm thick gate oxides
✍ Scribed by Jao-Hsian Shiue; Lee, J.Y.-M.; Tien-Sheng Chao
- Book ID
- 114537821
- Publisher
- IEEE
- Year
- 1999
- Tongue
- English
- Weight
- 234 KB
- Volume
- 46
- Category
- Article
- ISSN
- 0018-9383
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