Round-robin studies on relative sensitivity factors (RSFs) in secondary ion mass spectrometry (SIMS) were conducted using bulk GaAs samples uniformly doped with various impurity elements. A total of 31 laboratories participated in two round-robins. More than 30 sets of relative ion intensities were
β¦ LIBER β¦
A study of gold migration in Au-Y2O3-Y junctions by secondary ion mass spectrometry
β Scribed by A. Noya; S. Kuriki; G. Matsumoto; M. Hirano
- Book ID
- 103420569
- Publisher
- Elsevier Science
- Year
- 1979
- Tongue
- English
- Weight
- 223 KB
- Volume
- 59
- Category
- Article
- ISSN
- 0040-6090
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