✦ LIBER ✦
A study of ESD-induced defects in high-voltage nMOS and pMOS transistors : Paolo Pavan et al. Microelectron. J. 23, 45 (1992)
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 137 KB
- Volume
- 32
- Category
- Article
- ISSN
- 0026-2714
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