A study of Al/PtSi/Si thin film reaction kinetics by X-ray diffraction : C. C. Goldsmith, G. A. Walker and M. J. Sullivan. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 64

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 239 KB
• Volume: 18
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)90094-x