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A Study of Accelerated Life Test of White OLED Based on Maximum Likelihood Estimation Using Lognormal Distribution

✍ Scribed by Zhang, Jianping; Liu, Fang; Liu, Yu; Wu, Helen; Wu, Wenli; Zhou, Aixi


Book ID
125529989
Publisher
IEEE
Year
2012
Tongue
English
Weight
450 KB
Volume
59
Category
Article
ISSN
0018-9383

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