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A stochastic approach for the anodic-oxidation process for fine adjustment of the thin-film resistors : S. Kawarai, R. Koike and J. Moizumi. Trans. Inst. Electron. Commun. Engrs Japan55, No. 9, September (1972), p. 23


Publisher
Elsevier Science
Year
1973
Tongue
English
Weight
222 KB
Volume
12
Category
Article
ISSN
0026-2714

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