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A steady-state approach to determine diffusion coefficients: the migration of silicon on the Si(100) surface

✍ Scribed by C.M. Aldao; J.L. Iguain; H.O. Mártin


Book ID
116068812
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
506 KB
Volume
366
Category
Article
ISSN
0039-6028

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