A statistical approach to the analysis of dielectric breakdown strength of thin insulating films : K. Kristiansen. Vacuum27, (4) 227

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 127 KB
• Volume: 17
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)90707-2