𝔖 Bobbio Scriptorium
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A statistical approach to quality control of non-normal lithographical overlay distributions : R. M. Booth, jr, K. A. Tallman, T. J. Wiltshire and P. L. Yee. IBM Journal of Research and Development, 36(5), 835 (1992)


Book ID
103285296
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
109 KB
Volume
33
Category
Article
ISSN
0026-2714

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