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A statistical approach to fit Gaussian part of full-energy peaks from Si(PIN) and SDD X-ray spectrometers

✍ Scribed by Li, Zhe; Tuo, XianGuo; Shi, Rui; Yang, JianBo


Book ID
121579604
Publisher
SP Science China Press
Year
2013
Tongue
English
Weight
718 KB
Volume
57
Category
Article
ISSN
1006-9321

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