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A spectroscopic ellipsometry study on the variation of the optical constants of tin-doped indium oxide thin films during crystallization

✍ Scribed by Yeon Sik Jung

Book ID: 108269205
Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 267 KB
Volume: 129
Category: Article
ISSN: 0038-1098
DOI: 10.1016/j.ssc.2003.11.044

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