✦ LIBER ✦
A Spectro-Microscopic Approach for Thin Film Analysis: Grain Boundaries in mc-Si and Sn/SnO 2 Nano Particles
✍ Scribed by Hoffmann, Patrick ;Mikalo, Ricardo P. ;Yfantis, Alexandros ;Batchelor, David R. ;Appel, Guenter ;Yfantis, Dimitrios ;Schmei�er, Dieter
- Book ID
- 113051015
- Publisher
- Springer-Verlag
- Year
- 2001
- Weight
- 183 KB
- Volume
- 136
- Category
- Article
- ISSN
- 0344-838X
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