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A Space Mapping Methodology for Defect Characterization From Magnetic Flux Leakage Measurements

โœ Scribed by Amineh, R.K.; Koziel, S.; Nikolova, N.K.; Bandler, J.W.; Reilly, J.P.


Book ID
114652720
Publisher
IEEE
Year
2008
Tongue
English
Weight
766 KB
Volume
44
Category
Article
ISSN
0018-9464

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